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KMID : 0381920120420020105
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Korean Journal of Microscopy
2012 Volume.42 No. 2 p.105 ~ p.109
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Application of the Band-pass Filtering for Improving 3D Tomogram of Micron-thick Sections of Biological Specimens
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Ryu Keun-Yong
Kim Mi-Jeong
Choi Ki-Joo
Je A-Reum
Kim Soo-Jin
Lee Chul-Hyun
Jung Hyun-Suk
Park Jong-Won
Kweon Hee-Seok
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Abstract
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Electron tomography (ET) of biological specimens is performed from a series of images obtained over a range of tilt angles in a transmission electron microscope. When using the high voltage electron microscope (HVEM), various noises appear in EM images acquired from thick sections by high voltage electron beam. In order to obtain an adequate result in electron tomograms that allow visualization of rather complex and mega-cellular structure such as brain tissue, it is necessary to remove the noise in each original tilt images of thick section. Using band-pass filtering of original tilt images, the filtered images are obtained and used to assemble a reconstructed tomogram. The qualified 3D tomogram from filtered images results in a considerable reduction of the noises compared to conventional tomogram. In conclusion, this study suggests that band-pass filtering is effective to improve the brightness and intensity of HVEM produced tomograms acquired from micron-thick sections of biological specimens.
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KEYWORD
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Band-pass filter, Electron tomography, High voltage electron microscope
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